Share Email Print

Proceedings Paper

Simulating aperture masking at the Large Binocular Telescope
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Preliminary investigations for an Aperture Masking Experiment at the Large Binocular Telescope (LBT) and its application to stellar surface imaging are presented. An algorithm is implemented which generates non redundant aperture masks for the LBT. These masks are adapted to the special geometrical conditions at the LBT. At the same time, they are optimized to provide a uniform UV-coverage. It is also possible to favor certain baselines to adapt the UV-coverage to observational requirements. The optimization is done by selecting appropriate masks among a large number (order 109) of randomized realizations of non-redundant (NR) masks. Using results of numerical simulations of the surface of red supergiants, interferometric data is generated as it would be available with these masks at the LBT while observing Betelgeuse. An image reconstruction algorithm is used to reconstruct images from Squared Visibility and Closure Phase data. It is shown that a number of about 15 holes per mask is sufficient to retrieve detailed images. Additionally, noise is added to the data in order to simulate the influence of measurement errors e.g. photon noise. Both the position and the shape of surface structures are hardly influenced by this noise. However, the flux of these details changes significantly.

Paper Details

Date Published: 12 September 2012
PDF: 8 pages
Proc. SPIE 8445, Optical and Infrared Interferometry III, 84452H (12 September 2012); doi: 10.1117/12.926270
Show Author Affiliations
Julian Stürmer, Landessternwarte Heidelberg (Germany)
Andreas Quirrenbach, Landessternwarte Heidelberg (Germany)

Published in SPIE Proceedings Vol. 8445:
Optical and Infrared Interferometry III
Françoise Delplancke; Jayadev K. Rajagopal; Fabien Malbet, Editor(s)

© SPIE. Terms of Use
Back to Top