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Proceedings Paper

Performance of new generation swept charge devices for lunar x-ray spectroscopy on Chandrayaan-2
Author(s): P. H. Smith; J. P. D. Gow; N. J. Murray; A. D. Holland; M. Anand; P. Pool; P. Sreekumar; S. Narendranath
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Paper Abstract

The Chandrayaan-2 Large Area Soft X-ray spectrometer (CLASS) is due to be launched by the Indian Space Research Organisation (ISRO) in 2014. It will map the elemental composition of the lunar surface, building on the Chandrayaan-1 X-ray spectrometer (C1XS) heritage. CLASS will use an array of e2v technologies CCD236 swept charge devices (SCD) providing an active detector area of approximately 64 cm2, almost three times the active area of C1XS which used the first generation of SCD, the CCD54. The CCD236 is designed as a soft X-ray detector, 0.8 keV to 10 keV, and benefits from improvements in design to allow for increased detector area, a reduction in split X-ray events and improvements to radiation hardness. This paper describes the investigation into the performance requirements of the CCD236, focussing on an optimisation of the energy resolution of a device irradiated to the estimated worse case end of life proton fluence.

Paper Details

Date Published: 25 September 2012
PDF: 13 pages
Proc. SPIE 8453, High Energy, Optical, and Infrared Detectors for Astronomy V, 84530R (25 September 2012); doi: 10.1117/12.926213
Show Author Affiliations
P. H. Smith, e2v Ctr. for Electronic Imaging at The Open Univ. (United Kingdom)
J. P. D. Gow, e2v Ctr. for Electronic Imaging at The Open Univ. (United Kingdom)
N. J. Murray, e2v Ctr. for Electronic Imaging at The Open Univ. (United Kingdom)
A. D. Holland, e2v Ctr. for Electronic Imaging at The Open Univ. (United Kingdom)
M. Anand, e2v Ctr. for Electronic Imaging at The Open Univ. (United Kingdom)
P. Pool, e2v technologies plc (United Kingdom)
P. Sreekumar, ISRO Satellite Ctr. (India)
S. Narendranath, ISRO Satellite Ctr. (India)


Published in SPIE Proceedings Vol. 8453:
High Energy, Optical, and Infrared Detectors for Astronomy V
Andrew D. Holland; James W. Beletic, Editor(s)

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