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Proceedings Paper

Designing the METIS adaptive optics system
Author(s): R. Stuik; S. Hippler; A. Stolte; B. Brandl; F. Molster; L. Venema; R. Lenzen; E. Pantin; J. Blommaert; A. Glasse; M. Meyer
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Paper Abstract

METIS, the Mid-infrared E-ELT Imager and Spectrometer is foreseen to be the third instrument on the European Extremely Large Telescope (E-ELT) and the only instrument to provide high sensitivity mid-IR imaging and spectroscopy to the E-ELT. In order to reach the maximum resolution and sensitivity, an adaptive optics system is required. Since the operational wavelength of METIS is the longest of all E-ELT instruments and the field is relatively small, the complexity of the AO system is significantly reduced, both in required speed as well as order of the AO system. Adaptive Optics has been demonstrated to deliver consistently high performance for the current generation of 6-10 meter class telescopes at mid-infrared wavelengths, and similar performance is expected for METIS on the E-ELT. But in order to provide a reliable system on the E-ELT, several effects which have a minor impact on 6-8 meter class telescopes will need to be investigated for their impact on METIS AO. These effects include refractivity, atmospheric composition variations, but also the operation in a complex operational environment given by both METIS as well as the E-ELT. In this paper we describe the scientific requirements on the METIS AO system, the specific issues related to Adaptive Optics in the mid-IR and expected performance of the METIS AO system on the E-ELT.

Paper Details

Date Published: 13 September 2012
PDF: 7 pages
Proc. SPIE 8447, Adaptive Optics Systems III, 84473L (13 September 2012); doi: 10.1117/12.926137
Show Author Affiliations
R. Stuik, Leiden Observatory (Netherlands)
NOVA/ASTRON (Netherlands)
S. Hippler, Max-Planck-Institut für Astronomie (Germany)
A. Stolte, Argelander Institut für Astronomie, Univ. Bonn (Germany)
B. Brandl, Leiden Observatory (Netherlands)
F. Molster, NOVA (Netherlands)
L. Venema, NOVA/ASTRON (Netherlands)
R. Lenzen, Max-Planck-Institut für Astronomie (Germany)
E. Pantin, CE Saclay DSM/IRFU/SAp (France)
J. Blommaert, Katholieke Univ. Leuven (Belgium)
A. Glasse, UK Astronomy Technology Ctr. (United Kingdom)
M. Meyer, Institute of Astronomy, ETH Zürich (Switzerland)

Published in SPIE Proceedings Vol. 8447:
Adaptive Optics Systems III
Brent L. Ellerbroek; Enrico Marchetti; Jean-Pierre Véran, Editor(s)

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