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Proceedings Paper

A cryogenic set-up for accurate measurements of S-parameters
Author(s): M. Zannoni; A. Baù; A. Passerini; A. Tartari; M. Gervasi; L. Valenziano
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Paper Abstract

We have developed a set-up to perform measurements of S-parameters on devices operated at low temperature, using a Vector Network Analyzer in combination with a cryogenic chamber. High accuracy in the characterization of the devices is obtained using a set of TRL calibration standards operated at the same cryogenic temperature of the DUT. Measurements have been performed on Front-End-Modules of mm-wave receivers including cryogenic LNA developed within our collaboration.

Paper Details

Date Published: 24 September 2012
PDF: 6 pages
Proc. SPIE 8452, Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VI, 84522R (24 September 2012); doi: 10.1117/12.925995
Show Author Affiliations
M. Zannoni, Univ. degli Studi di Milano Bicocca (Italy)
A. Baù, Univ. degli Studi di Milano Bicocca (Italy)
A. Passerini, Univ. degli Studi di Milano Bicocca (Italy)
A. Tartari, Univ. Paris Diderot (France)
Univ. degli Studi di Milano Bicocca (Italy)
M. Gervasi, Univ. degli Studi di Milano Bicocca (Italy)
L. Valenziano, IASF-INAF Bologna (Italy)


Published in SPIE Proceedings Vol. 8452:
Millimeter, Submillimeter, and Far-Infrared Detectors and Instrumentation for Astronomy VI
Wayne S. Holland, Editor(s)

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