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Proceedings Paper

Device modelling and model verification for the Euclid CCD273 detector
Author(s): A. Clarke; D. Hall; N. Murray; A. Holland; D. Burt
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Paper Abstract

Euclid is one of the M-class missions selected for the next phase of ESA’s long-term Cosmic Vision programme. The primary goal of this mission is to observe the distribution and shapes of distant galaxies, with the aim of mapping and characterising the dark energy which makes up about 70% of the universe. This will be achieved by measuring the effects of weak lensing on the captured images, in terms of the distortion caused to the elipticity of galaxy shapes [1]. The e2v CCD273 was designed for the Euclid mission and is adapted from an older design (the CCD203) with changes made to improve CTE under irradiation by solar protons. Reducing the effects of radiation damage in the image sensor will result in images which have minimal distortion. This paper is focused on the on-going development and verification of 3D device models and their integration with Monte Carlo radiation damage models. Parameters such as charge interaction volume versus signal size, pixel full well capacity, and charge transfer behaviour for both the parallel and serial registers will be discussed. The main mission goals are aimed at measuring distortion due to weak lensing, so it is important to differentiate this from distortion due to radiation damage. This work will eventually lead to a method of post processing images to remove the effects of radiation damage.

Paper Details

Date Published: 25 September 2012
PDF: 10 pages
Proc. SPIE 8453, High Energy, Optical, and Infrared Detectors for Astronomy V, 84531I (25 September 2012); doi: 10.1117/12.925887
Show Author Affiliations
A. Clarke, e2v Ctr. for Electronic Imaging at The Open Univ. (United Kingdom)
D. Hall, e2v Ctr. for Electronic Imaging at The Open Univ. (United Kingdom)
N. Murray, e2v Ctr. for Electronic Imaging at The Open Univ. (United Kingdom)
A. Holland, e2v Ctr. for Electronic Imaging at The Open Univ. (United Kingdom)
D. Burt, e2v technologies plc (United Kingdom)


Published in SPIE Proceedings Vol. 8453:
High Energy, Optical, and Infrared Detectors for Astronomy V
Andrew D. Holland; James W. Beletic, Editor(s)

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