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Proceedings Paper

Development of the super-high angular resolution principle for x-ray imaging: experimental demonstrations
Author(s): Chen Zhang; Zhixing Ling; Shuang-Nan Zhang
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Paper Abstract

Experimental demonstrations of the Super-High Angular Resolution Principle (SHARP) for coded aperture imaging are presented. SHARP has been theoretically proven to be an extension of the coded aperture imaging system by taking advantage of the significant diffraction-interference effects of pinholes on the mask, which operates beyond the diffraction limit of a single pinhole. We first set up an optical experiment, the so-called SHARP-O, in order to verify the theoretical predictions on SHARP. The images of point sources are successfully reconstructed, with an angular resolution of about 26 arcsec and position accuracy of 2 arcsec, whereas the diffraction limit of a single mask pinhole in the mask is 870 arcsec. We then set up a SHARP-X demonstration experiment at an X-ray beam line facility; encouraging results are obtained, indicating that the SHARP concept is feasible in the soft X-ray band. It is thus possible to achieve sub-arcsec X-ray imaging with a simple coded mask system working beyond the diffraction limit of a single pinhole.

Paper Details

Date Published: 17 September 2012
PDF: 11 pages
Proc. SPIE 8443, Space Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray, 84433X (17 September 2012); doi: 10.1117/12.925780
Show Author Affiliations
Chen Zhang, National Astronomical Observatories (China)
Zhixing Ling, National Astronomical Observatories (China)
Shuang-Nan Zhang, National Astronomical Observatories (China)
Institute of High Energy Physics (China)


Published in SPIE Proceedings Vol. 8443:
Space Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray
Tadayuki Takahashi; Stephen S. Murray; Jan-Willem A. den Herder, Editor(s)

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