Share Email Print
cover

Proceedings Paper

A mask quality control tool for the OSIRIS multi-object spectrograph
Author(s): J. C. López-Ruiz; Jacinto Javier Vaz Cedillo; Alessandro Ederoclite; Ángel Bongiovanni; Víctor González Escalera
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

OSIRIS multi object spectrograph uses a set of user-customised-masks, which are manufactured on-demand. The manufacturing process consists of drilling the specified slits on the mask with the required accuracy. Ensuring that slits are on the right place when observing is of vital importance. We present a tool for checking the quality of the process of manufacturing the masks which is based on analyzing the instrument images obtained with the manufactured masks on place. The tool extracts the slit information from these images, relates specifications with the extracted slit information, and finally communicates to the operator if the manufactured mask fulfills the expectations of the mask designer. The proposed tool has been built using scripting languages and using standard libraries such as opencv, pyraf and scipy. The software architecture, advantages and limits of this tool in the lifecycle of a multiobject acquisition are presented.

Paper Details

Date Published: 24 September 2012
PDF: 13 pages
Proc. SPIE 8451, Software and Cyberinfrastructure for Astronomy II, 84511Q (24 September 2012); doi: 10.1117/12.925682
Show Author Affiliations
J. C. López-Ruiz, Instituto de Astrofísica de Canarias (Spain)
Univ. de la Laguna (Spain)
Jacinto Javier Vaz Cedillo, Instituto de Astrofísica de Canarias (Spain)
Alessandro Ederoclite, Ctr. de Estudios de Física del Cosmos de Aragón (Spain)
Ángel Bongiovanni, Instituto de Astrofísica de Canarias (Spain)
Univ. de la Laguna (Spain)
Víctor González Escalera, Instituto de Astrofísica de Canarias (Spain)


Published in SPIE Proceedings Vol. 8451:
Software and Cyberinfrastructure for Astronomy II
Nicole M. Radziwill; Gianluca Chiozzi, Editor(s)

© SPIE. Terms of Use
Back to Top