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Proceedings Paper

Echelle gratings for the near-infrared
Author(s): Kenneth H. Hinkle; Richard R. Joyce; Bernhard W. Bach; Erich Bach; Kirk G. Bach; Brooke M. Beam; Gary Poczulp; Verne V. Smith; Lloyd Wallace
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Paper Abstract

We report on echelle gratings produced by diamond turning with groove spacings coarser than 20 lines per mm. Increasing the groove spacing of an echelle reduces the free spectral range allowing infrared orders to be matched to the detector size. Reflection echelle gratings designed for the near-infrared have potential wide application in both ambient temperature as well as cryogenic astronomical spectrographs. Diamond turned reflection echelle gratings are currently employed in space-based high-resolution spectrographs for 2 – 4 μm planetary spectroscopy. Using a sample diamond turned grating we investigate the suitability of a 15 line/mm R3 echelle for use in ground-based 1 – 5 μm spectroscopy. We find this grating suitable for 3 – 5 μm high signal-to-noise, high-resolution applications. Controlling wavefront errors by an additional factor of two would permit use at high-resolution in the 1.5 – 2.5 μm region.

Paper Details

Date Published: 24 September 2012
PDF: 10 pages
Proc. SPIE 8446, Ground-based and Airborne Instrumentation for Astronomy IV, 84463B (24 September 2012); doi: 10.1117/12.925476
Show Author Affiliations
Kenneth H. Hinkle, National Optical Astronomy Observatory (United States)
Richard R. Joyce, National Optical Astronomy Observatory (United States)
Bernhard W. Bach, Bach Research Corp. (United States)
Erich Bach, Bach Research Corp. (United States)
Kirk G. Bach, Bach Research Corp. (United States)
Brooke M. Beam, Univ. of Arizona (United States)
Gary Poczulp, National Optical Astronomy Observatory (United States)
Verne V. Smith, National Optical Astronomy Observatory (United States)
Lloyd Wallace, National Optical Astronomy Observatory (United States)


Published in SPIE Proceedings Vol. 8446:
Ground-based and Airborne Instrumentation for Astronomy IV
Ian S. McLean; Suzanne K. Ramsay; Hideki Takami, Editor(s)

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