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Proceedings Paper

Modelling charge transfer in a radiation damaged charge coupled device for Euclid
Author(s): David J. Hall; Andrew Holland; Neil Murray; Jason Gow; Andrew Clarke
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Paper Abstract

As electrons are transferred through a radiation damaged Charge Coupled Device (CCD), they may encounter traps in the silicon in which they will be captured and subsequently released. This capture and release of electrons can lead to a 'smearing' of the image. The dynamics of the trapping process can be described through the use of Shockley-Read-Hall theory, in which exponential time constants are used to determine the probability of capture and release. If subjected to a hostile radiation environment, such as in space where the dominant charged particle is the proton, these incident protons can cause displacement damage within the CCD and lead to the formation of stable trap sites. As the trap density increases, the trapping and release of signal electrons can have a major impact on the Charge Transfer Efficiency (CTE) to the detriment of device performance. As the science goals for missions become ever more demanding, such as those for the ESA Euclid and Gaia missions, the problem of radiation damage must be overcome. In order to gain a deeper understanding of the trapping process and the impact on device performance, a Monte Carlo simulation has been developed to model the transfer of charge in a radiation damaged CCD. This study investigates the various difficulties encountered when developing such a model: the incorporation of appropriate clocking mechanisms, the use of suitable trap parameters and their degeneracy, and the development of methods to model the charge storage geometry within a pixel through the use of three-dimensional Silvaco simulations.

Paper Details

Date Published: 25 September 2012
PDF: 12 pages
Proc. SPIE 8453, High Energy, Optical, and Infrared Detectors for Astronomy V, 845315 (25 September 2012); doi: 10.1117/12.925394
Show Author Affiliations
David J. Hall, e2v Ctr. for Electronic Imaging at The Open Univ. (United Kingdom)
Andrew Holland, e2v Ctr. for Electronic Imaging at The Open Univ. (United Kingdom)
Neil Murray, e2v Ctr. for Electronic Imaging at The Open Univ. (United Kingdom)
Jason Gow, e2v Ctr. for Electronic Imaging at The Open Univ. (United Kingdom)
Andrew Clarke, e2v Ctr. for Electronic Imaging at The Open Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 8453:
High Energy, Optical, and Infrared Detectors for Astronomy V
Andrew D. Holland; James W. Beletic, Editor(s)

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