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Proceedings Paper

Failure of thin organic films by a combination of shearography and electrochemical impedance spectroscopy: the new concept of resistivity
Author(s): Khaled Habib
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Paper Abstract

A critical (steady state) value of the resistivity of different organic coatings was determined by a combination of optical shearography and electrochemical impedance spectroscopy (EIS). The behavior of organic coatings, i.e., ACE premiumgray enamel, white enamel, beige enamel (spray coatings), a yellow acrylic lacquer, and a gold nail polish on a metallic alloy, i.e., a carbon steel, was investigated over a temperature range of 20-60 °C. The value of the resistivity of coatings was determined by correlating the in-plan displacement of the coating (by shearography over a temperature range of 20- 60 °C) and the value of the alternating current (A.C) impedance of the coating by EIS in 3% NaCl solution. The integrity of the coatings with respect to time was assessed by comparison the measured value of resistivity to the critical (steady state) or asymptotic value of resistivity. In other words, by shearography, measurement of coating properties could be performed independent of parameters such as UV exposure, humidity, presence of chemical species, and other parameters which may normally interfere with conventional methods of the assessing of the integrity of coatings. Therefore, one may measure the resistivity of coatings, regardless of the history of the coating, in order to assess the integrity of coatings. Also, the obtained shearography data were found to be in a reasonable trend with the data of electrochemical impedance spectroscopy (EIS) in 3%NaCl solution.

Paper Details

Date Published: 5 May 2012
PDF: 15 pages
Proc. SPIE 8430, Optical Micro- and Nanometrology IV, 84300B (5 May 2012); doi: 10.1117/12.924232
Show Author Affiliations
Khaled Habib, Kuwait Institute for Scientific Research (Kuwait)

Published in SPIE Proceedings Vol. 8430:
Optical Micro- and Nanometrology IV
Christophe Gorecki; Anand K. Asundi; Wolfgang Osten, Editor(s)

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