Share Email Print
cover

Proceedings Paper

Nondestructive and noncontact evaluation on FRP composite laminates using a terahertz ray
Author(s): Je-Woong Park; Kwang-Hee Im; David K. Hsu; Chien-Ping Chiou; Dan Barnard; Jong-An Jung; In-Young Yang
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Recently, a terahertz ray (T-ray) technique has emerged as one of the most promising new powerful nondestructive evaluation (NDE) techniques, and new application systems are under processing development for the area applications. In this study T-ray technique will be adopted for the characterization of the FRP composite solid laminates as an imaging and useful nondestructive evaluation (NDE) tool. So, in order to detect and evaluate the flaws in FRP solid composite laminates a new time-domain spectroscopy system was utilized. Various experimental measurements in reflection and through-transmission modes were made in order to map out the T-ray images. Especially in this characterization procedure, we estimated the electromagnetic properties such as the refractive index and a couple of techniques were proposed to measure the refractive index. It is found that estimations of properties with the proposed different ways are in good agreement with known data. Furthermore woven CFRP Honey comb sandwich panel with Al wire were observed in reflection mode and limitations will be mentioned in the T-ray processing.

Paper Details

Date Published: 13 April 2012
PDF: 6 pages
Proc. SPIE 8409, Third International Conference on Smart Materials and Nanotechnology in Engineering, 84091I (13 April 2012); doi: 10.1117/12.924046
Show Author Affiliations
Je-Woong Park, Chosun Univ. (Korea, Republic of)
Kwang-Hee Im, Woosuk Univ. (Korea, Republic of)
David K. Hsu, Iowa State Univ. (United States)
Chien-Ping Chiou, Iowa State Univ. (United States)
Dan Barnard, Iowa State Univ. (United States)
Jong-An Jung, Songwon College (Korea, Republic of)
In-Young Yang, Chosun Univ. (Korea, Republic of)


Published in SPIE Proceedings Vol. 8409:
Third International Conference on Smart Materials and Nanotechnology in Engineering

© SPIE. Terms of Use
Back to Top