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Proceedings Paper

High spatial resolution x-ray image detector for non-destructive examination of materials
Author(s): Mkrtich A. Mkrtchyan; Ashot G. Petrosyan
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Paper Abstract

A high spatial resolution X-ray image detector is designed and costructed. The detector consists of a scintillator, light microscopy optics and charge-coupled device (CCD). The scintillator has a mosaic form with 4x5 mm2 area and consists of 1x1x0.3 mm3 elements fabricated from Y3Al5O12:Ce (YAG:Ce) and Gd3Ga5O12:Ce (GGG:Ce) bulk crystals. Using "Zemax" program the mirror-lens microscopic optical system is calculated and constructed. The Philips FTF4052M CCD has 4008(H) x 5344(V) active pixels (pixel size 9um) with sensitive area 36.072 mm x 48.096 mm. The detector has been characterized using visible-light images. X-ray images from a mosaic of scintillation crystals were also obtained. The estimated spatial resolution of the detector is 1 μm.

Paper Details

Date Published: 25 January 2012
PDF: 6 pages
Proc. SPIE 8414, Photonics and Micro- and Nano-structured Materials 2011, 84140P (25 January 2012); doi: 10.1117/12.923470
Show Author Affiliations
Mkrtich A. Mkrtchyan, National Scientific Lab. after A. Alikhanyan (Armenia)
Ashot G. Petrosyan, Institute for Physical Research (Armenia)

Published in SPIE Proceedings Vol. 8414:
Photonics and Micro- and Nano-structured Materials 2011
Rafael Kh. Drampyan, Editor(s)

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