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Proceedings Paper

Nanosensor technology based on semiconductor nanocrystals
Author(s): Jörg Martin; Ulrike Staudinger; Emrah Demir; Christian Spudat; Petra Pötschke; Brigitte Voit; Thomas Otto; Thomas Gessner
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Paper Abstract

We present a new concept of material integrated sensor technology for detection, storage and visualization of mechanical stress and load conditions. Key feature is a double layer consisting of a piezoelectric layer and a semiconductor nanocrystal polymer composite film. Electrical charges are generated within the piezo layer by application of a mechanical load to the structure. The charges are transferred to the composite film and injected into the nanocrystals, causing non-radiative exciton recombination. This results in photoluminescence quenching, which can be detected as local optical contrast. The photoluminescence of CdSe/ZnS core/shell quantum dots has been switched off by application of external voltages smaller than 20 V. It was possible to store the charges in the QDs, and hence the off-state, for several hours. Optical contrast ratios up to 1:125 have been detected so far.

Paper Details

Date Published: 2 February 2012
PDF: 7 pages
Proc. SPIE 8264, Integrated Optics: Devices, Materials, and Technologies XVI, 82641M (2 February 2012); doi: 10.1117/12.922954
Show Author Affiliations
Jörg Martin, Fraunhofer-Institut für Elektronische Nanosysteme (Germany)
Ulrike Staudinger, Leibniz-Institut für Polymerforschung Dresdene e.V. (Germany)
Emrah Demir, Leibniz-Institut für Polymerforschung Dresdene e.V. (Germany)
Christian Spudat, Fraunhofer-Institut für Elektronische Nanosysteme (Germany)
Petra Pötschke, Leibniz-Institut für Polymerforschung Dresdene e.V. (Germany)
Brigitte Voit, Leibniz-Institut für Polymerforschung Dresdene e.V. (Germany)
Thomas Otto, Fraunhofer-Institut für Elektronische Nanosysteme (Germany)
Thomas Gessner, Fraunhofer-Institut für Elektronische Nanosysteme (Germany)

Published in SPIE Proceedings Vol. 8264:
Integrated Optics: Devices, Materials, and Technologies XVI
Jean Emmanuel Broquin; Gualtiero Nunzi Conti, Editor(s)

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