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Proceedings Paper

Robustness of the scanning second harmonic generation microscopy technique for characterization of hotspot patterns in plasmonic nanomaterials
Author(s): V. K. Valev; B. De Clercq; X. Zheng; C. G. Biris; N. C. Panoiu; A. V. Silhanek; V. Volskiy; O. A. Aktsipetrov; G. A. E. Vandenbosch; M. Ameloot; V. V. Moshchalkov; T. Verbiest
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Paper Abstract

Scanning second harmonic generation (SHG) microscopy is becoming an important tool for characterizing nanopatterned metal surfaces and mapping plasmonic local field enhancements. Here we study G-shaped and mirror-G-shaped gold nanostructures and test the robustness of the experimental results versus the direction of scanning, the numerical aperture of the objective, the magnification, and the size of the laser spot on the sample. We find that none of these parameters has a significant influence on the experimental results.

Paper Details

Date Published: 1 May 2012
PDF: 8 pages
Proc. SPIE 8424, Nanophotonics IV, 842411 (1 May 2012); doi: 10.1117/12.922880
Show Author Affiliations
V. K. Valev, Katholieke Univ. Leuven (Belgium)
B. De Clercq, Univ. Hasselt (Belgium)
X. Zheng, Katholieke Univ. Leuven (Belgium)
C. G. Biris, Univ. College London (United Kingdom)
N. C. Panoiu, Univ. College London (United Kingdom)
A. V. Silhanek, Univ. de Liège (Belgium)
V. Volskiy, Katholieke Univ. Leuven (Belgium)
O. A. Aktsipetrov, Lomonosov Moscow State Univ. (Russian Federation)
G. A. E. Vandenbosch, Katholieke Univ. Leuven (Belgium)
M. Ameloot, Univ. Hasselt (Belgium)
V. V. Moshchalkov, Katholieke Univ. Leuven (Belgium)
T. Verbiest, Katholieke Univ. Leuven (Belgium)


Published in SPIE Proceedings Vol. 8424:
Nanophotonics IV
David L. Andrews; Jean-Michel Nunzi; Andreas Ostendorf, Editor(s)

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