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Proceedings Paper

Ellipsometrical detection of optical trapped nanoparticles by periodically localized light
Author(s): Naoya Taki; Yasuhiro Mizutani; Tetsuo Iwata; Takao Kojima; Hiroki Yamamoto; Takahiro Kozawa
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Paper Abstract

The purpose of this study is development of a trapping system for nano-particles by periodically localized light and of a detecting system for the trapped state by an ellipsometoric method. Nano-particles are of interest for some different attractive properties with a bulk body in terms of their reactivity. Those attractive properties are applicable to production of an optical element and a device. For production of nano-particles, it is necessary to manipulate nano-particles and to measure the trapped state without contact in micro region. In this study, periodically localized light which is generated by the nano-periodic structure allows us to trap nano-particles. Evaluation of trapping can be accomplished by using a rotating-analyzer ellipsometer for comparing the ellipsometrical parameter before and after trapping. In confirmation of affectivity ellipsometrical method, we obtained that the trapped state associated with varying a shape of the nanoperiodic structure depends on polarization properties. The trapping light intensity also was found to depend on trapping volume of the nano-particles. From experimental results, the nano-particles can be trapped by the periodically localized light. And the trapping volume was found to increase with increasing in trapping light intensity. Hence, this system achieved trapping and deducing nano-particles.

Paper Details

Date Published: 4 May 2012
PDF: 8 pages
Proc. SPIE 8430, Optical Micro- and Nanometrology IV, 84300Y (4 May 2012); doi: 10.1117/12.922879
Show Author Affiliations
Naoya Taki, The Univ. of Tokushima (Japan)
Yasuhiro Mizutani, The Univ. of Tokushima (Japan)
Tetsuo Iwata, The Univ. of Tokushima (Japan)
Takao Kojima, Osaka Prefecture Univ. (Japan)
Hiroki Yamamoto, Osaka Univ. (Japan)
Takahiro Kozawa, Osaka Univ. (Japan)

Published in SPIE Proceedings Vol. 8430:
Optical Micro- and Nanometrology IV
Christophe Gorecki; Anand K. Asundi; Wolfgang Osten, Editor(s)

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