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Proceedings Paper

Diffractive optics development with stack-and-draw technique
Author(s): J. M. Nowosielski; A. Filipkowski; A. J. Waddie; I. Kujawa; R. Stepien; R. Buczynski; M. R. Taghizadeh
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Paper Abstract

We present a novel approach to the fabrication of diffractive optical elements. Unlike traditional diffractive optical elements, the different phase shifts are obtained through a refractive index variation by using different types of glass. This approach results in a completely flat element which is easy to integrate with other optical components. For fabrication of the test DOE structures we have used the stack-and-draw technique. This method, which was originally developed for the fabrication of photonic crystal fibres, has been modified to allow the fabrication of nanostructured micro-optical components. In this paper we present the results from proof of concept periodic checkerboards fabricated on a square and hexagonal lattice with feature sizes of 8μm and 46μm. The components were fabricated from two types of rods made of the low refractive index silicate glass and the high refractive index of lead-silicate glass. The measured characteristics of the fabricated components are presented The influence of fabrication-induced structure distortions on the optical performance of the components is discussed.

Paper Details

Date Published: 8 May 2012
PDF: 7 pages
Proc. SPIE 8428, Micro-Optics 2012, 84281R (8 May 2012); doi: 10.1117/12.922847
Show Author Affiliations
J. M. Nowosielski, Heriot-Watt Univ. (United Kingdom)
Univ. of Warsaw (Poland)
A. Filipkowski, Heriot-Watt Univ. (United Kingdom)
Institute of Electronic Materials Technology (Poland)
A. J. Waddie, Heriot-Watt Univ. (United Kingdom)
I. Kujawa, Institute of Electronic Materials Technology (Poland)
R. Stepien, Institute of Electronic Materials Technology (Poland)
R. Buczynski, Univ. of Warsaw (Poland)
Institute of Electronic Materials Technology (Poland)
M. R. Taghizadeh, Heriot-Watt Univ. (United Kingdom)


Published in SPIE Proceedings Vol. 8428:
Micro-Optics 2012
Hugo Thienpont; Jürgen Mohr; Hans Zappe; Hirochika Nakajima, Editor(s)

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