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Proceedings Paper

Simultaneous multi-state stimulated emission in quantum dot lasers: experiment and analytical approach
Author(s): V. V. Korenev; A. V. Savelyev; A. E. Zhukov; A. V. Omelchenko; M. V. Maximov; Yu. M. Shernyakov
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Paper Abstract

The theoretical investigation of the double-state lasing phenomena in InAs/InGaAs quantum dot lasers has been carried out. The new mechanism of the ground-state lasing quenching, which takes place in quantum dot (QD) laser operating in double-state lasing regime at high pump level, was proposed. The difference between electron and hole capture rates causes the depletion of the hole levels and consequently leads to the decrease of an output lasing power via QD ground state with the growth of injection. Moreover, it was shown that the hole-to-electron capture rates ratio strongly affects both the light-current curve and the key laser parameters. The model of the simultaneous lasing through the ground and excited QD states was developed which allows to describe the observed quenching quantitatively.

Paper Details

Date Published: 11 May 2012
PDF: 6 pages
Proc. SPIE 8432, Semiconductor Lasers and Laser Dynamics V, 84321L (11 May 2012); doi: 10.1117/12.922754
Show Author Affiliations
V. V. Korenev, St. Petersburg Academic Univ. (Russian Federation)
A. V. Savelyev, St. Petersburg Academic Univ. (Russian Federation)
St. Petersburg State Polytechnical Univ. (Russian Federation)
A. E. Zhukov, St. Petersburg Academic Univ. (Russian Federation)
St. Petersburg State Polytechnical Univ. (Russian Federation)
Ioffe Physico-Technical Institute (Russian Federation)
A. V. Omelchenko, St. Petersburg Academic Univ. (Russian Federation)
St. Petersburg State Polytechnical Univ. (Russian Federation)
M. V. Maximov, St. Petersburg Academic Univ. (Russian Federation)
Ioffe Physico-Technical Institute (Russian Federation)
Yu. M. Shernyakov, Ioffe Physico-Technical Institute (Russian Federation)


Published in SPIE Proceedings Vol. 8432:
Semiconductor Lasers and Laser Dynamics V
Krassimir Panajotov; Marc Sciamanna; Angel Valle; Rainer Michalzik, Editor(s)

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