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Proceedings Paper

Extremely thin metamaterial absorbers for subterahertz waves: from fundamentals towards applications in uncooled bolometric sensors
Author(s): Sergey A. Kuznetsov; Andrey G. Paulish; Alexander V. Gelfand; Mikhail A. Astafiev; Andrey V. Arzhannikov; Victor N. Fedorinin; Manfred K. A. Thumm
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Paper Abstract

We present the selected results of theoretical and experimental investigations of high-performance ultra-thin metamaterial-inspired absorbers designed for narrow-band operation at subterahertz frequencies and intended for integration with spectrally-selective bolometric devices. The attainability of values up to 182 for the ratio of the free-space wavelength to the absorber's thickness is experimentally demonstrated, while realizability of even thinner structures is shown. The first prototypes of spectrophotometric and imaging detectors with metamaterial-based radiation-sensitive pixels, utilizing a principle of THz-to-IR conversion, are discussed.

Paper Details

Date Published: 1 May 2012
PDF: 15 pages
Proc. SPIE 8423, Metamaterials VII, 84230S (1 May 2012); doi: 10.1117/12.922728
Show Author Affiliations
Sergey A. Kuznetsov, Novosibirsk State Univ. (Russian Federation)
Budker Institute of Nuclear Physics (Russian Federation)
Andrey G. Paulish, Novosibirsk State Univ. (Russian Federation)
A.V. Rzhanov Institute of Semiconductor Physics (Russian Federation)
Alexander V. Gelfand, Novosibirsk State Univ. (Russian Federation)
A.V. Rzhanov Institute of Semiconductor Physics (Russian Federation)
Mikhail A. Astafiev, Novosibirsk State Univ. (Russian Federation)
Andrey V. Arzhannikov, Novosibirsk State Univ. (Russian Federation)
Budker Institute of Nuclear Physics (Russian Federation)
Victor N. Fedorinin, Novosibirsk State Univ. (Russian Federation)
A.V. Rzhanov Institute of Semiconductor Physics (Russian Federation)
Manfred K. A. Thumm, Novosibirsk State Univ. (Russian Federation)
Karlsruhe Institute of Technology (Germany)


Published in SPIE Proceedings Vol. 8423:
Metamaterials VII
Allan D. Boardman; Nigel P. Johnson; Richard W. Ziolkowski, Editor(s)

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