Share Email Print

Proceedings Paper

Sub-micron resolution high-speed spectral domain optical coherence tomography in quality inspection for printed electronics
Author(s): J. Czajkowski; J. Lauri; R. Sliz; P. Fält; T. Fabritius; R. Myllylä; B. Cense
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We present the use of sub-micron resolution optical coherence tomography (OCT) in quality inspection for printed electronics. The device used in the study is based on a supercontinuum light source, Michelson interferometer and high-speed spectrometer. The spectrometer in the presented spectral-domain optical coherence tomography setup (SD-OCT) is centered at 600 nm and covers a 400 nm wide spectral region ranging from 400 nm to 800 nm. Spectra were acquired at a continuous rate of 140,000 per second. The full width at half maximum of the point spread function obtained from a Parylene C sample was 0:98 m. In addition to Parylene C layers, the applicability of sub-micron SD-OCT in printed electronics was studied using PET and epoxy covered solar cell, a printed RFID antenna and a screen-printed battery electrode. A commercial SD-OCT system was used for reference measurements.

Paper Details

Date Published: 4 May 2012
PDF: 8 pages
Proc. SPIE 8430, Optical Micro- and Nanometrology IV, 84300K (4 May 2012); doi: 10.1117/12.922443
Show Author Affiliations
J. Czajkowski, Univ. of Oulu (Finland)
J. Lauri, Univ. of Oulu (Finland)
R. Sliz, Univ. of Oulu (Finland)
P. Fält, Univ. of Eastern Finland (Finland)
T. Fabritius, Univ. of Oulu (Finland)
R. Myllylä, Univ. of Oulu (Finland)
B. Cense, Utsunomiya Univ. (Japan)

Published in SPIE Proceedings Vol. 8430:
Optical Micro- and Nanometrology IV
Christophe Gorecki; Anand K. Asundi; Wolfgang Osten, Editor(s)

© SPIE. Terms of Use
Back to Top