Share Email Print
cover

Proceedings Paper

Influence of Fresnel diffraction on numerical propagation and correction of tilted image planes in digital holographic microscopy
Author(s): Frank Schlichthaber; Gert von Bally; Björn Kemper
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In order to achieve high resolution quantitative imaging in digital holographic microscopy (DHM) typically microscope lenses with a high numerical aperture are applied. This results in a low depth of field (DOF) of the optical imaging system. Thus, for example, surfaces and specimens that cannot be imaged in parallel with the hologram recording device are recorded partly defocused. We explored the compensation of such defocusing effects by partial numerical propagation of the complex wave fields that are retrieved from digitally recorded off-axis holograms. The numerical propagation of small wave field parts with low pixel numbers is strongly affected by Fresnel diffraction and aliasing. Thus, the influence of these effects was quantified and used in an adapted algorithm for numerical refocusing of tilted image planes that considers the DOF of the applied optical imaging system. Results from simulations and experimental investigations show that typical numerical propagation artifacts origin from Fresnel diffraction which efficiently can be suppressed by an adequate adaptation of the numerical propagation. Data from the application of the resulting algorithm demonstrates that images planes with a tilt of up to 80 degrees to the hologram plane can be compensated.

Paper Details

Date Published: 26 April 2012
PDF: 8 pages
Proc. SPIE 8430, Optical Micro- and Nanometrology IV, 843003 (26 April 2012); doi: 10.1117/12.922373
Show Author Affiliations
Frank Schlichthaber, Univ. of Münster (Germany)
Gert von Bally, Univ. of Münster (Germany)
Björn Kemper, Univ. of Münster (Germany)


Published in SPIE Proceedings Vol. 8430:
Optical Micro- and Nanometrology IV
Christophe Gorecki; Anand K. Asundi; Wolfgang Osten, Editor(s)

© SPIE. Terms of Use
Back to Top