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Proceedings Paper

Perfect imaging of three object points with only two analytic lens surfaces in two dimensions
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Paper Abstract

In this work, a new two-dimensional analytic optics design method is presented that enables the coupling of three ray sets with two lens profiles. This method is particularly promising for optical systems designed for wide field of view and with clearly separated optical surfaces. However, this coupling can only be achieved if different ray sets will use different portions of the second lens profile. Based on a very basic example of a single thick lens, the Simultaneous Multiple Surfaces design method in two dimensions (SMS2D) will help to provide a better understanding of the practical implications on the design process by an increased lens thickness and a wider field of view. Fermat's principle is used to deduce a set of functional differential equations fully describing the entire optical system. The transformation of these functional differential equations into an algebraic linear system of equations allows the successive calculation of the Taylor series coefficients up to an arbitrary order. The evaluation of the solution space reveals the wide range of possible lens configurations covered by this analytic design method. Ray tracing analysis for calculated 20th order Taylor polynomials demonstrate excellent performance and the versatility of this new analytical optics design concept.

Paper Details

Date Published: 5 May 2012
PDF: 9 pages
Proc. SPIE 8429, Optical Modelling and Design II, 842908 (5 May 2012); doi: 10.1117/12.922089
Show Author Affiliations
Fabian Duerr, Vrije Univ. Brussel (Belgium)
Pablo Benítez, Univ. Politécnica de Madrid (Spain)
Light Prescriptions Innovators LLC (United States)
Juan Carlos Miñano, Univ. Politécnica de Madrid (Spain)
Light Prescriptions Innovators LLC (United States)
Youri Meuret, Vrije Univ. Brussel (Belgium)
Hugo Thienpont, Vrije Univ. Brussel (Belgium)


Published in SPIE Proceedings Vol. 8429:
Optical Modelling and Design II
Frank Wyrowski; John T. Sheridan; Jani Tervo; Youri Meuret, Editor(s)

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