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Proceedings Paper

Optoelectronic phase noise measurement system with wideband analysis
Author(s): Patrice Salzenstein; Abdelhamid Hmima; Mikhail Zarubin; Ekaterina Pavlyuchenko; Nathalie Cholley
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Paper Abstract

The use of a shorter delay line in a optoelectronic phase noise measurement system working in X-band, allow a characterization of the phase noise far from the carrier. Fourier frequency analysis can be extended from 105 to 2.106 Hz by introducing a 100 m delay line in addition of a 2 km optical fiber.

Paper Details

Date Published: 9 May 2012
PDF: 5 pages
Proc. SPIE 8439, Optical Sensing and Detection II, 84391M (9 May 2012); doi: 10.1117/12.921630
Show Author Affiliations
Patrice Salzenstein, CNRS, Institut Franche Comté Electronique Thermique Optique Sciences et Technologie (France)
Abdelhamid Hmima, CNRS, Institut Franche Comté Electronique Thermique Optique Sciences et Technologie (France)
Mikhail Zarubin, CNRS, Institut Franche Comté Electronique Thermique Optique Sciences et Technologie (France)
Ekaterina Pavlyuchenko, CNRS, Institut Franche Comté Electronique Thermique Optique Sciences et Technologie (France)
Nathalie Cholley, CNRS, Institut Franche Comté Electronique Thermique Optique Sciences et Technologie (France)


Published in SPIE Proceedings Vol. 8439:
Optical Sensing and Detection II
Francis Berghmans; Anna Grazia Mignani; Piet De Moor, Editor(s)

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