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Proceedings Paper

Large-format InGaAs focal plane arrays for SWIR imaging
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Paper Abstract

FLIR Electro Optical Components will present our latest developments in large InGaAs focal plane arrays, which are used for low light level imaging in the short wavelength infrared (SWIR) regime. FLIR will present imaging from their latest small pitch (15 μm) focal plane arrays in VGA and High Definition (HD) formats. FLIR will present characterization of the FPA including dark current measurements as well as the use of correlated double sampling to reduce read noise. FLIR will show imagery as well as FPA-level characterization data.

Paper Details

Date Published: 31 May 2012
PDF: 7 pages
Proc. SPIE 8353, Infrared Technology and Applications XXXVIII, 83530A (31 May 2012); doi: 10.1117/12.921475
Show Author Affiliations
Andrew D. Hood, FLIR Electro-Optical Components (United States)
Michael H. MacDougal, FLIR Electro-Optical Components (United States)
Juan Manzo, FLIR Electro-Optical Components (United States)
David Follman, FLIR Electro-Optical Components (United States)
Jonathan C. Geske, FLIR Electro-Optical Components (United States)


Published in SPIE Proceedings Vol. 8353:
Infrared Technology and Applications XXXVIII
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)

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