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Proceedings Paper

Charge diffusion measurement in fully depleted CCD using 55Fe X-rays
Author(s): I. V. Kotov; A. I. Kotov; J. Frank; P. Kubanek; P. O'Connor; V. Radeka; P. Takacs
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Paper Abstract

Tight requirements on the Large Synoptic Survey Telescope point spread function (PSF) demand sensor contribution to PSF be both small and well characterized. The sensor PSF is determined by the lateral charge diffusion on the drift path from the photon conversion point to the gates. The maximum drift path occurs for photons converted at the window, for blue optical photons in particular. Charges generated at the window surface undergo "worst case" charge spreading and the blue optical PSF is used to characterize the sensor's PSF. Different techniques for charge diffusion characterization have been developed, each with its own systematics and measurement difficulties. A new way to measure charge diffusion using an X-ray source is presented. We demonstrate the effectiveness and limitations of our technique and discuss relation of charge diffusion value obtained with X-ray measurements to sensor PSF.

Paper Details

Date Published: 25 September 2012
PDF: 6 pages
Proc. SPIE 8453, High Energy, Optical, and Infrared Detectors for Astronomy V, 84531B (25 September 2012); doi: 10.1117/12.921327
Show Author Affiliations
I. V. Kotov, Brookhaven National Lab. (United States)
A. I. Kotov, Brookhaven National Lab. (United States)
J. Frank, Brookhaven National Lab. (United States)
P. Kubanek, Institute of Physics of the ASCR, v.v.i. (Czech Republic)
P. O'Connor, Brookhaven National Lab. (United States)
V. Radeka, Brookhaven National Lab. (United States)
P. Takacs, Brookhaven National Lab. (United States)


Published in SPIE Proceedings Vol. 8453:
High Energy, Optical, and Infrared Detectors for Astronomy V
Andrew D. Holland; James W. Beletic, Editor(s)

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