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Proceedings Paper

Ultra-compact illumination module for multi-aperture imaging systems
Author(s): René Berlich; Andreas Brückner; Robert Leitel; Andreas Bräuer
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Proc. SPIE 8250, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI, 82500D; doi: 10.1117/12.921307
Show Author Affiliations
René Berlich, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Andreas Brückner, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Robert Leitel, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)
Andreas Bräuer, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)


Published in SPIE Proceedings Vol. 8250:
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS and Nanodevices XI
Sonia M. García-Blanco; Rajeshuni Ramesham, Editor(s)

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