Share Email Print
cover

Proceedings Paper

Discharge light and carbonization distribution characteristics at XLPE-silicon rubber interface with micro-cavity in tracking failure test
Author(s): L. Gu; S. Li; S. B. Wang; S. L. Lei; S. X. Liu
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Installation of cross-linked polyethylene (XLPE) cable joint possibly introduces defects into the XLPE-silicon rubber interface, such as micro-cavity and micro-wire. Those defects greatly decrease the interfacial breakdown strength and endanger the stability of power system. However, the traditional method only measures the breakdown strength, which alone is limited and can not provide detailed information to more clearly understand the dielectric performance and tracking failure mechanism. This paper investigated the effect of micro-cavity on tracking failure by analyzing the distribution characteristics of discharge light and carbonization. Interfaces with those defects were setup by pressing together a slice of XLPE and a slice of transparent silicon rubber. A 50 Hz AC voltage was applied on a pair of flat-round electrodes sandwiched at the interface with their insulation distance of 5 mm until tracking failure occurred. The evolution of both discharge light and carbonization at the interface from discharge to the failure was recorded with a video recorder and then their channel width was analyzed with image processing method. Obtained results show that micro-cavity at an XLPE-silicon rubber interface strengthens the transportation of charge and easily leads to interfacial discharge and tracking failure. The distribution of discharge light and carbonization at the interface with micro-wire proves this.

Paper Details

Date Published: 13 January 2012
PDF: 6 pages
Proc. SPIE 8350, Fourth International Conference on Machine Vision (ICMV 2011): Computer Vision and Image Analysis; Pattern Recognition and Basic Technologies, 83501Z (13 January 2012); doi: 10.1117/12.921060
Show Author Affiliations
L. Gu, Chongqing Univ. of Technology (China)
S. Li, Chongqing Univ. of Technology (China)
S. B. Wang, Chongqing Univ. of Technology (China)
S. L. Lei, Chongqing Univ. of Technology (China)
S. X. Liu, Chongqing Univ. of Technology (China)


Published in SPIE Proceedings Vol. 8350:
Fourth International Conference on Machine Vision (ICMV 2011): Computer Vision and Image Analysis; Pattern Recognition and Basic Technologies
Safaa S. Mahmoud; Zhu Zeng; Yuting Li, Editor(s)

© SPIE. Terms of Use
Back to Top