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Proceedings Paper

Use of electron diffraction for determination of strain distribution in synthetic diamonds
Author(s): S. Balovsyak; M. Borcha; Ya. Garabazhiv; I. Fodchuk; V. Tkach
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Paper Abstract

In this paper we demonstrate possibilities of electron backscattering diffraction technique (Kikuchi method) for determination of strain distribution in local areas of synthetic diamond samples. To increase the precision of lattice parameter determination a correlation method and corresponding software were used for accurate identification of coordinates of Kikuchi lines intersections on the Kikuchi patterns. Consequently, subjective factors influencing on accuracy at determination of displacements of image details were minimized. Samples have been investigated by scanning electron microscope "Zeiss" EVO-50 using CCD detector. The complex analysis of location changes of Kikuchi lines intersections and Kikuchi line intensity profiles permits to specify peculiarities of strain distribution for diamonds grown by various methods.

Paper Details

Date Published: 23 November 2011
PDF: 6 pages
Proc. SPIE 8338, Tenth International Conference on Correlation Optics, 83381D (23 November 2011); doi: 10.1117/12.921051
Show Author Affiliations
S. Balovsyak, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
M. Borcha, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Ya. Garabazhiv, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
I. Fodchuk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
V. Tkach, V. N.Bakul Institute of Superhard Materials (Ukraine)


Published in SPIE Proceedings Vol. 8338:
Tenth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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