Share Email Print
cover

Proceedings Paper

Visualization of active crack on bridge in use by mechanoluminescent sensor
Author(s): Nao Terasaki; Chao-Nan Xu; Chenshu Li; Lin Zhang; Chengzhou Li; Daisuke Ono; Masayoshi Tsubai; Yoshio Adachi; Yusuke Imai; Naohiro Ueno; Toshio Shinokawa
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Innovative mechanoluminescent (ML) particles emit light repeatedly in response to small stresses applied, such as deformation, friction, or impact. When dispersedly coated on a structure, each particle acts as a sensitive mechanical sensor, while the 2-dimentional emission pattern of the whole assembly reflects well the dynamical stress distribution inside the structure and mechanical information around crack and defect. Thus, we have applied the remarkable strong points of ML sensing technique to a bridge in use as a real social structure for the first time. For the first ML monitoring test at bridge, we selected a relatively old bridge (established in 1954, 3-span continuous T-type RC bridge, length 24.4 m, width: 7.89 m). The ML sheet type sensors were put around the central area (700×400 mm) of the main girder, and ML images originated from dynamic load application via general traffic vehicles had recorded by using lab-made CCD camera under roughly dark condition. As the result, we successfully detected intense ML patterns not only along visible crack but also at round soundless part on the girder at a glance with responding ML intensity reflecting the crack mouth opening displacement (CMOD) of visible crack and invisible progressing microcrack.

Paper Details

Date Published: 20 April 2012
PDF: 6 pages
Proc. SPIE 8348, Health Monitoring of Structural and Biological Systems 2012, 83482D (20 April 2012); doi: 10.1117/12.921036
Show Author Affiliations
Nao Terasaki, National Institute of Advanced Industrial Science and Technology (Japan)
Chao-Nan Xu, National Institute of Advanced Industrial Science and Technology (Japan)
Japan Science and Technology Agency (Japan)
Chenshu Li, National Institute of Advanced Industrial Science and Technology (Japan)
Lin Zhang, National Institute of Advanced Industrial Science and Technology (Japan)
Chengzhou Li, National Institute of Advanced Industrial Science and Technology (Japan)
Daisuke Ono, National Institute of Advanced Industrial Science and Technology (Japan)
Masayoshi Tsubai, National Institute of Advanced Industrial Science and Technology (Japan)
Yoshio Adachi, National Institute of Advanced Industrial Science and Technology (Japan)
Yusuke Imai, National Institute of Advanced Industrial Science and Technology (Japan)
Naohiro Ueno, National Institute of Advanced Industrial Science and Technology (Japan)
Toshio Shinokawa, Taisei Kiso Sekkei Co., Ltd. (Japan)


Published in SPIE Proceedings Vol. 8348:
Health Monitoring of Structural and Biological Systems 2012
Tribikram Kundu, Editor(s)

© SPIE. Terms of Use
Back to Top