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Proceedings Paper

High-dose implantation of Y2,95La0,05Fe5O12 epitaxial films by nitrogen ions
Author(s): N. Pashniak; I. Fodchuk; A. Davydok; A. Biermanns; U. Pietsch; S. Balovsyak; R. Zaplitniy; I. Gutsuliak; O. Bonchyk; G. Savitskiy; I. Vivorotka; V. Stefanyk; I. Yaremiy
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Paper Abstract

The investigations of structural changes in epitaxial films of iron-yttrium garnet (IYG) Y2,95La0,05Fe5O12 after high dose ion implantation with nitrogen ions were performed using X-ray diffraction methods. The behaviour of structural transformations after irradiation of Y2,95La0,05Fe5O12 crystals by the nitrogen ions was established by means of choice of the proper models of defect structure that contain several types of dominant micro defects and definitely distributed surface damaged layer. It is shown that reorganization of the crystal structure under the influence of high-doze nitrogen ion implantation leads to improved magnetic properties of Y2,95La0,05Fe5O12 epitaxial films.

Paper Details

Date Published: 22 November 2011
PDF: 9 pages
Proc. SPIE 8338, Tenth International Conference on Correlation Optics, 83381C (22 November 2011); doi: 10.1117/12.921008
Show Author Affiliations
N. Pashniak, Univ. Siegen (Germany)
I. Fodchuk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
A. Davydok, Univ. Siegen (Germany)
A. Biermanns, Univ. Siegen (Germany)
U. Pietsch, Univ. Siegen (Germany)
S. Balovsyak, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
R. Zaplitniy, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
I. Gutsuliak, Univ. Siegen (Germany)
O. Bonchyk, Institute for Applied Problems of Mechanics and Mathematics (Ukraine)
G. Savitskiy, Institute for Applied Problems of Mechanics and Mathematics (Ukraine)
I. Vivorotka, Institute for Applied Problems of Mechanics and Mathematics (Ukraine)
V. Stefanyk, V. Stefanyk Prykarpatskyy National Univ. (Ukraine)
I. Yaremiy, V. Stefanyk Prykarpatskyy National Univ. (Ukraine)


Published in SPIE Proceedings Vol. 8338:
Tenth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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