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Proceedings Paper

X-ray moiré patterns of silicon crystals with distortions caused by local concentrated forces
Author(s): Igor M. Fodchuk; Igor V. Fesiv; Sergiy M, Novikov; Yaroslav M. Struk
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Paper Abstract

We study the mechanisms of forming X-ray moiré images arising under the action of one-dimensional rows of local concentrated forces at output surface of a surface of triple-crystalline-interferometer for the cases of orientation of them parallel and perpendicular to the vector of diffraction. Presence of constant phase shift of one of the interfering waves in the interferometer's analyzer results in diminishing of period, contrast and area of deformation moiré fringes. It is shown that the area of efficient interaction of phase and deformation moirés depends on both the magnitude of the constant phase shift and on the magnitude and character of arrangement of local concentrated forces in rows.

Paper Details

Date Published: 22 November 2011
PDF: 7 pages
Proc. SPIE 8338, Tenth International Conference on Correlation Optics, 833819 (22 November 2011); doi: 10.1117/12.921007
Show Author Affiliations
Igor M. Fodchuk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Igor V. Fesiv, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Sergiy M, Novikov, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Yaroslav M. Struk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)


Published in SPIE Proceedings Vol. 8338:
Tenth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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