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Proceedings Paper

The features of x-ray topographic contrast formation in silicon with dislocation clusters
Author(s): Igor M. Fodchuk; Sergiy M. Novikov; Andriy Ya. Struk
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Paper Abstract

The features of formation of diffraction images of edge dislocation sets forming clusters (of two, three and more dislocations) as well as small-angle dislocation boundaries (walls) were studied. Various intensity interference effects of rescattering and internal reflection of the newly formed and already existing wave fields on thickness distributions of intensity for the case of presence in the same glide plane of edge dislocations with parallel and anti-parallel Burgers vectors were discovered.

Paper Details

Date Published: 22 November 2011
PDF: 8 pages
Proc. SPIE 8338, Tenth International Conference on Correlation Optics, 83381B (22 November 2011); doi: 10.1117/12.920984
Show Author Affiliations
Igor M. Fodchuk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Sergiy M. Novikov, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)
Andriy Ya. Struk, Yuriy Fedkovych Chernivtsi National Univ. (Ukraine)


Published in SPIE Proceedings Vol. 8338:
Tenth International Conference on Correlation Optics
Oleg V. Angelsky, Editor(s)

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