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Proceedings Paper

Hybrid structural health monitoring for in-service highway bridges using wireless multiscale sensors
Author(s): Shinae Jang; Sushil Dahal; Gustavo K. Contreras; Jonathan Fitch; Jonathan Karamavros; Rajeev Bansal
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Paper Abstract

With the rapid development of electrical circuits, Micro electromechanical system (MEMS) and network technology, wireless smart sensor networks (WSSN) have shown significant potential for replacing existing wired Structural health monitoring (SHM) systems due to their cost effectiveness and versatility. A few structural systems have been monitored using WSSN measuring acceleration, temperature, wind speed, humidity; however, a multi-scale sensing device which has the capability to measure the displacement has not been yet developed. In this project, a new highaccuracy displacement sensing system has been developed combining a high resolution analog displacement sensor and MEMS-based wireless microprocessor platform. The wireless sensor is calibrated in the laboratory to get the high precision displacement data from analog sensor. The developed multi-scale sensing system is evaluated in a laboratory bridge structure to check its performance. Finally, the developed hybrid multi-scale displacement sensing system was deployed on in-service highway bridge for SHM.

Paper Details

Date Published: 3 April 2012
PDF: 6 pages
Proc. SPIE 8345, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2012, 83451Y (3 April 2012); doi: 10.1117/12.920866
Show Author Affiliations
Shinae Jang, Univ. of Connecticut (United States)
Sushil Dahal, Univ. of Connecticut (United States)
Gustavo K. Contreras, Univ. of Connecticut (United States)
Jonathan Fitch, Univ. of Connecticut (United States)
Jonathan Karamavros, Univ. of Connecticut (United States)
Rajeev Bansal, Univ. of Connecticut (United States)

Published in SPIE Proceedings Vol. 8345:
Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2012
Masayoshi Tomizuka; Chung-Bang Yun; Jerome P. Lynch, Editor(s)

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