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Proceedings Paper

Enhanced e-beam pattern writing for nano-optics based on character projection
Author(s): E.-Bernhard Kley; Holger Schmidt; Uwe Zeitner; Michael Banasch; Bernd Schnabel
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Paper Abstract

The pattern generation for nano-optics raises high demands on resolution, writing speed and flexibility: nearly arbitrary complex structures with feature sizes below 100 nm should be realized on large areas up to 9 inches in square within reasonable time. With e-beam lithography the requirements on resolution and flexibility can be fulfilled but the writing time becomes the bottle neck. Acceleration by Variable Shaped Beam (VSB) writing principle (geometrical primitives with flexible size can be exposed with a single shot) is sometimes not sufficient. Character Projection (CP) is able to speed up the writing drastically because complex pattern of a limited area can be exposed by one shot [1]. We tested CP in the Vistec SB350 OS for optical applications and found a shot count reduction up to 1/1000, especially for geometries which are hard to approximate by geometrical primitives. Additionally, the resolution and the pattern quality were influenced in a positive way. Another benefit is the possibility to spend a part of the gain in writing speed to the use of a high resolution but low sensitive resist like HSQ. The tradeoff between speed and flexibility should be compensable by a large number of characters available.

Paper Details

Date Published: 16 April 2012
PDF: 8 pages
Proc. SPIE 8352, 28th European Mask and Lithography Conference, 83520M (16 April 2012); doi: 10.1117/12.920562
Show Author Affiliations
E.-Bernhard Kley, Friedrich-Schiller-Univ. Jena (Germany)
Holger Schmidt, Friedrich-Schiller-Univ. Jena (Germany)
Uwe Zeitner, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)
Michael Banasch, Vistec Electron Beam GmbH (Germany)
Bernd Schnabel, Vistec Electron Beam GmbH (Germany)

Published in SPIE Proceedings Vol. 8352:
28th European Mask and Lithography Conference
Uwe F.W. Behringer; Wilhelm Maurer, Editor(s)

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