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Proceedings Paper

Fault diagnosis based on signed directed graph and support vector machine
Author(s): Xiaoming Han; Qing Lv; Gang Xie; Jianxia Zheng
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Paper Abstract

Support Vector Machine (SVM) based on Structural Risk Minimization (SRM) of Statistical Learning Theory has excellent performance in fault diagnosis. However, its training speed and diagnosis speed are relatively slow. Signed Directed Graph (SDG) based on deep knowledge model has better completeness that is knowledge representation ability. However, much quantitative information is not utilized in qualitative SDG model which often produces a false solution. In order to speed up the training and diagnosis of SVM and improve the diagnostic resolution of SDG, SDG and SVM are combined in this paper. Training samples' dimension of SVM is reduced to improve training speed and diagnosis speed by the consistent path of SDG; the resolution of SDG is improved by good classification performance of SVM. The Matlab simulation by Tennessee-Eastman Process (TEP) simulation system demonstrates the feasibility of the fault diagnosis algorithm proposed in this paper.

Paper Details

Date Published: 13 January 2012
PDF: 6 pages
Proc. SPIE 8349, Fourth International Conference on Machine Vision (ICMV 2011): Machine Vision, Image Processing, and Pattern Analysis, 83491H (13 January 2012); doi: 10.1117/12.920384
Show Author Affiliations
Xiaoming Han, Taiyuan Univ. of Technology (China)
Qing Lv, Taiyuan Univ. of Technology (China)
Gang Xie, Taiyuan Univ. of Technology (China)
Jianxia Zheng, Taiyuan Univ. of Technology (China)


Published in SPIE Proceedings Vol. 8349:
Fourth International Conference on Machine Vision (ICMV 2011): Machine Vision, Image Processing, and Pattern Analysis
Zhu Zeng; Yuting Li, Editor(s)

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