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Proceedings Paper

Terahertz imaging with missing data analysis for metamaterials characterization
Author(s): Andre Sokolnikov
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Paper Abstract

Terahertz imaging proves advantageous for metamaterials characterization since the interaction of THz radiation with the metamaterials produces clear patterns of the material. Characteristic "finger prints" of the crystal structure help locating defects, dislocations, contamination, etc. TDS-THz spectroscopy is one of the tools to control metamaterials design and manufacturing. A computational technique is suggested that provides a reliable way of calculation of the metamaterials structure parameters, spotting defects. Based on missing data analysis, the applied signal processing facilitates a better quality image while compensating for partially absent information. Results are provided.

Paper Details

Date Published: 9 May 2012
PDF: 12 pages
Proc. SPIE 8363, Terahertz Physics, Devices, and Systems VI: Advanced Applications in Industry and Defense, 83630X (9 May 2012); doi: 10.1117/12.920183
Show Author Affiliations
Andre Sokolnikov, Visual Solutions and Applications (United States)


Published in SPIE Proceedings Vol. 8363:
Terahertz Physics, Devices, and Systems VI: Advanced Applications in Industry and Defense
A. F. Mehdi Anwar; Nibir K. Dhar; Thomas W. Crowe, Editor(s)

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