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Proceedings Paper

An infrared polarized scene generator for hardward-in-the-loop (HWIL) testing
Author(s): Peter S. Erbach; Joseph L. Pezzaniti; David B. Chenault; John Reinhardt; Todd Aycock; Brian Hyatt; Heard S. Lowry
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Paper Abstract

Polarization signature information is becoming more useful as an added discriminant in a variety of signature analysis applications. However, there are few infrared scene projection systems that provide the capability to inject object simulation images with polarization content into an imaging sensor. In this paper, we discuss a polarization scene generator that is applicable to testing polarimetric sensor systems. The system was originally designed for operation in cryogenic-vacuum environments to test sensors subject to cold operation. However, it is also applicable to testing warm sensors that are sensitive to polarimetric signatures. This polarization scene generator is currently designed for mid-wave infrared (MWIR) operation. It includes two table-top sparse emitter arrays with individually addressable pixels, polarizers, a beam combiner, and filters to provide flexibility in spectral content. The emitter arrays are combined to generate an output with independent linearly polarized content. The current system generates S1 polarization states, S2 polarization states, or a linear combination of the two. The concept is robust because it is relatively unconstrained by the infrared (IR) scene generators used or the sensors tested.

Paper Details

Date Published: 1 May 2012
PDF: 15 pages
Proc. SPIE 8356, Technologies for Synthetic Environments: Hardware-in-the-Loop XVII, 835607 (1 May 2012); doi: 10.1117/12.920158
Show Author Affiliations
Peter S. Erbach, Polaris Sensor Technologies, Inc. (United States)
Joseph L. Pezzaniti, Polaris Sensor Technologies, Inc. (United States)
David B. Chenault, Polaris Sensor Technologies, Inc. (United States)
John Reinhardt, Polaris Sensor Technologies, Inc. (United States)
Todd Aycock, Polaris Sensor Technologies, Inc. (United States)
Brian Hyatt, Polaris Sensor Technologies, Inc. (United States)
Heard S. Lowry, Aerospace Testing Alliance (United States)


Published in SPIE Proceedings Vol. 8356:
Technologies for Synthetic Environments: Hardware-in-the-Loop XVII
James A. Buford; R. Lee Murrer; Gary H. Ballard, Editor(s)

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