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Proceedings Paper

Nanoscale chemical composition mapping of polymers at 100nm spatial resolution with AFM-based IR spectroscopy
Author(s): Michael Lo; Craig Prater; Alexandre Dazzi; Roshan Shetty; Kevin Kjoller
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Paper Abstract

Atomic Force Microscopy (AFM) and infrared (IR) spectroscopy have been combined in a single instrument capable of producing sub-micron spatial resolution IR spectra and images. This new capability enables the sprectroscopic characterization of microdomain-forming polymers at levels not previously possible. Films of poly(3-hydroxybutyrate-co-3-hydroxyheanoate) were solution cast on ZnSe prisms. Dramitic differences in the IR spectra are observed in the 1200-1300 cm-1 range as a funstion of position on a spatial scale of less than one micron. This spectral region is particularly sensitive to the polymer crystallinity, enabling the identification of crystalline and amorphous domains within a single spherulite of this polymer.

Paper Details

Date Published: 3 May 2012
PDF: 4 pages
Proc. SPIE 8373, Micro- and Nanotechnology Sensors, Systems, and Applications IV, 83730L (3 May 2012); doi: 10.1117/12.919809
Show Author Affiliations
Michael Lo, Anasys Instruments Corp. (United States)
Craig Prater, Anasys Instruments Corp. (United States)
Alexandre Dazzi, Univ. Paris-Sud (France)
Roshan Shetty, Anasys Instruments Corp. (United States)
Kevin Kjoller, Anasys Instruments Corp. (United States)


Published in SPIE Proceedings Vol. 8373:
Micro- and Nanotechnology Sensors, Systems, and Applications IV
Thomas George; M. Saif Islam; Achyut Dutta, Editor(s)

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