Share Email Print
cover

Proceedings Paper

Radar cross section statistics of cultural clutter at Ku-band
Author(s): Ann Marie Raynal; Douglas L. Bickel; Dale F. Dubbert; Tobias J. Verge; Bryan L. Burns; Ralf Dunkel; Armin W. Doerry
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Knowing the statistical characteristics of the radar cross-section (RCS) of man-made, or cultural clutter, is crucial to the success of clutter mitigation, radar target detection algorithms, and radar system requirements in urban environments. Open literature studies regarding the statistical nature of cultural clutter focus primarily on radar probability models or limited experimental data analysis of specific locations and frequencies. This paper seeks to expand the existing body of work on cultural clutter RCS statistics at Ku-band for ground moving target indication (GMTI) and synthetic aperture radar (SAR) applications. We examine the normalized RCS probability distributions of cultural clutter in several urban scenes, across aspect and elevation angle, for vertical transmit/receive (VV) polarizations, and at diverse resolutions, using experimental data collected at Ku-band. We further describe frequency and RCS strength statistics of clutter discretes per unit area to understand system demands on radars operating in urban environments in this band.

Paper Details

Date Published: 8 May 2012
PDF: 12 pages
Proc. SPIE 8361, Radar Sensor Technology XVI, 83610Y (8 May 2012); doi: 10.1117/12.919789
Show Author Affiliations
Ann Marie Raynal, Sandia National Labs. (United States)
Douglas L. Bickel, Sandia National Labs. (United States)
Dale F. Dubbert, Sandia National Labs. (United States)
Tobias J. Verge, General Atomics Aeronautical Systems, Inc. (United States)
Bryan L. Burns, Sandia National Labs. (United States)
Ralf Dunkel, General Atomics Aeronautical Systems, Inc. (United States)
Armin W. Doerry, Sandia National Labs. (United States)


Published in SPIE Proceedings Vol. 8361:
Radar Sensor Technology XVI
Kenneth I. Ranney; Armin W. Doerry, Editor(s)

© SPIE. Terms of Use
Back to Top