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Proceedings Paper

Laser speckle MTF processing and test development for VIS and IR sensors
Author(s): Paul P. K. Lee; Craig W. McMurtry; Edwin J. Tan; Judith L. Pipher; Mark V. Bocko; J. Daniel Newman
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Paper Abstract

Using band-limited LASER speckle to measure the Modulation Transfer Function (MTF) of an image sensor offers simplified procedure and inexpensive laboratory set up compared with the traditional method of using a knife edge on the sensor imaging plane. This speckle technique has been previously demonstrated by Glen Boreman's group on devices in the visible range. We have extended the procedure to short-wave infrared (IR) sensor at 1.55 micron. Similar measurements were also made at 532 nanometer on a commercial visible (VIS) sensor. The experiments show that the LASER speckle method to be accurate when compared to knife-edge measurements for data below Nyquist. The measured MTF data support optical system design and image quality modeling for both VIS and IR sensing applications.

Paper Details

Date Published: 18 May 2012
PDF: 6 pages
Proc. SPIE 8355, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII, 835507 (18 May 2012); doi: 10.1117/12.919726
Show Author Affiliations
Paul P. K. Lee, ITT Exelis Geospatial Systems (United States)
Craig W. McMurtry, Univ. of Rochester (United States)
Edwin J. Tan, Univ. of Rochester (United States)
Judith L. Pipher, Univ. of Rochester (United States)
Mark V. Bocko, Univ. of Rochester (United States)
J. Daniel Newman, ITT Exelis Geospatial Systems (United States)

Published in SPIE Proceedings Vol. 8355:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII
Gerald C. Holst; Keith A. Krapels, Editor(s)

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