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Proceedings Paper

Surrounding sensitivity of nanophotonic structures in Morpho butterfly scales
Author(s): Wenjun Wu; Tielin Shi; Guanglan Liao; Cheng Zeng
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Paper Abstract

The main objective of this paper is to reveal the mechanism of surrounding-sensitivity and improve it by designing nanostructures. Inspection of this sensitivity factor is further analyzed based on the micro/nano structures naturally located in Morpho butterfly scales. The theory of multilayer-thin-film interference is introduced to explain the surrounding-sensitivity. We also analyzed two dimensional optical models with similar geometrical designs to authenticate reciprocally with the theory and to steer the engineering design of artificial butterfly scales towards a new platform for chemical sensors. Rigorous coupled-wave analysis technique was employed for theoretical calculation of vector diffraction problems. It turned out that multilayer-thin-film interference, which occurs over structure composed of alternating films of high and low refractive index, was the main factor of surrounding-sensitivity. And the sensitivity is improved by the change of nanostructure material and some geometrical characteristics. These results can be implemented into the engineering designs of artificial butterfly scales for sensitive and selective detection of closely related chemicals.

Paper Details

Date Published: 13 March 2012
PDF: 9 pages
Proc. SPIE 8329, Tenth International Conference on Photonics and Imaging in Biology and Medicine (PIBM 2011), 83290Q (13 March 2012); doi: 10.1117/12.919654
Show Author Affiliations
Wenjun Wu, Huazhong Univ. of Science and Technology (China)
Hubei Univ. of Technology (China)
Tielin Shi, Huazhong Univ. of Science and Technology (China)
Guanglan Liao, Huazhong Univ. of Science and Technology (China)
Cheng Zeng, WISDRI Engineering & Research Inc. Ltd. (China)


Published in SPIE Proceedings Vol. 8329:
Tenth International Conference on Photonics and Imaging in Biology and Medicine (PIBM 2011)
Qingming Luo; Lihong V. Wang; Valery V. Tuchin, Editor(s)

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