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Proceedings Paper

Development of low excess noise SWIR APDs
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Paper Abstract

There is a strong interest in developing sensitive Short Wavelength Infrared (SWIR) avalanche photodiodes (APDs) for applications like eye safe laser ranging and robotic vision. The excess noise associated with the avalanche process is critical in dictating the sensitivity of APDs. InGaAs APDs that are commonly used in the SWIR region have either InP or InAlAs as an avalanche layer and these materials have excess noise factor of 0.5 and 0.22, respectively. Earlier, Spectrolab had developed APDs with impact ionization engineering (I2E) structures based on InAlAs and InGaAlAs heterostructures as avalanche layers. These I2E APDs showed an excess noise factor of 0.15. A photoreceiver based on the I2E APD exhibited an noise equivalent power (NEP) of 150 fW/rt(Hz) over 1 GHz bandwidth at 1.06 μm. In this paper, a new multiplier structure based on multiple stages of I2E is studied. The APDs show optical gains over 100 before device breakdown. The increased gain and low excess noise will improve the sensitivity of InGaAs APDs based photoreceivers.

Paper Details

Date Published: 31 May 2012
PDF: 7 pages
Proc. SPIE 8353, Infrared Technology and Applications XXXVIII, 83532H (31 May 2012); doi: 10.1117/12.919397
Show Author Affiliations
Xiaogang Bai, Boeing Spectrolab Inc. (United States)
Ping Yuan, Boeing Spectrolab Inc. (United States)
Paul McDonald, Boeing Spectrolab Inc. (United States)
Joseph Boisvert, Boeing Spectrolab Inc. (United States)
James Chang, Boeing Spectrolab Inc. (United States)
Rengarajan Sudharsanan, Boeing Spectrolab Inc. (United States)
Michael Krainak, NASA Goddard Space Flight Ctr. (United States)
Guangning Yang, NASA Goddard Space Flight Ctr. (United States)
Xiaoli Sun, NASA Goddard Space Flight Ctr. (United States)
Wei Lu, NASA Goddard Space Flight Ctr. (United States)
Zhiwen Lu, Univ. of Virginia (United States)
Qiugui Zhou, Univ. of Virginia (United States)
Wenlu Sun, Univ. of Virginia (United States)
Joe Campbell, Univ. of Virginia (United States)


Published in SPIE Proceedings Vol. 8353:
Infrared Technology and Applications XXXVIII
Bjørn F. Andresen; Gabor F. Fulop; Paul R. Norton, Editor(s)

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