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Proceedings Paper

An experimental validation of the Gauss-Markov model for nonuniformity noise in infrared focal plane array sensors
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Paper Abstract

The aim of this research is to experimentally validate a Gauss-Markov model, previously developed by our group, for the non-uniformity parameters of infrared (IR) focal plane arrays (FPAs). The Gauss-Markov model assumed that both, the gain and the offset parameters at each detector, are random state-variables modeled by a recursive discrete-time process. For simplicity, however, we have regarded here the gain parameter as a constant and assumed that solely the offset parameter follows a Gauss-Markov model. Experiments have been conducted at room temperature and IR data was collected from black-body radiator sources using microbolometer-based IR cameras operating in the 8 to 12 μm. Next, well-known statistical techniques were used to analyze the offset time series and determinate whether the Gauss-Markov model truly fits the temporal dynamics of the offset. The validity of the Gauss-Markov model for the offset parameter was tested at two time scales: seconds and minutes. It is worth mentioning that the statistical analysis conducted in this work is a key in providing mechanisms for capturing the drift in the fixed pattern noise parameters.

Paper Details

Date Published: 18 May 2012
PDF: 8 pages
Proc. SPIE 8355, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII, 83551G (18 May 2012); doi: 10.1117/12.919367
Show Author Affiliations
Octavio Zapata, Univ. de Concepcion (Chile)
Felipe Pedreros, Univ. de Concepcion (Chile)
Sergio N. Torres, Univ. de Concepcion (Chile)


Published in SPIE Proceedings Vol. 8355:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII
Gerald C. Holst; Keith A. Krapels, Editor(s)

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