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Proceedings Paper

On-axis and off-axis characterization of MWIR and LWIR imaging systems using quadri-wave interferometry
Author(s): Sabrina Velghe; Djamel Brahmi; William Boucher; Benoit Wattellier
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Paper Abstract

The Quadri-Wave Lateral Shearing Interferometry (QWLSI) is an innovative wave front sensing technique that is commercially available for MWIR and LWIR applications. We present this technology and its application to the metrology, on and off-axis, of infrared imaging systems. The bench is only composed of a collimated reference beam that creates a source point at infinity, the objective to analyze and the sensor placed a few millimeters after the focal spot. Thanks to this direct measurement configuration, the alignment process is very simple and fast. A complete characterization (aberrations, MTF, field curvature) for several field points is possible within a few minutes.

Paper Details

Date Published: 18 May 2012
PDF: 8 pages
Proc. SPIE 8355, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII, 83550B (18 May 2012); doi: 10.1117/12.919204
Show Author Affiliations
Sabrina Velghe, PHASICS S.A. (France)
Djamel Brahmi, PHASICS S.A. (France)
William Boucher, PHASICS S.A. (France)
Benoit Wattellier, PHASICS S.A. (France)


Published in SPIE Proceedings Vol. 8355:
Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII
Gerald C. Holst; Keith A. Krapels, Editor(s)

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