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Proceedings Paper

Detection limit of imaging Raman spectroscopy
Author(s): Markus Nordberg; Ema Ceco; Sara Wallin; Henric Östmark
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Paper Abstract

Multispectral imaging Raman spectroscopy is a novel technique for detecting and identifying explosive residues, e.g. explosives particles which are left on surfaces after handling or manufacturing of explosives. By imaging a suspect surface using the imaging Raman technique, explosives particles at stand-off distances can be identified and displayed using color coding1. In this paper we present an attempt to determine a limit of detection for imaging Raman spectroscopy by analyzing holes of various sizes in aluminum plates filled with four different substances; 2,4-dinitrotoulene (DNT), ammonium nitrate (AN), sulfur, and 2,4,6-trinitrotoulene (TNT). The detection time in the presented experiments has not been optimized, instead more effort has been invested in order to reduce false alarms. The detection system used is equipped with a green second harmonic Nd:YAG laser with an average power of 2 W, a 200 mm telescope and a liquid crystal tunable filter to scan the wavenumbers. The distance to the target was 10 m and the imaged area was 28 mm × 28 mm. The measured multi-spectral data cubes were evaluated using least square fitting to distinguish between DNT, AN,S, TNT and the background. The detection limit has been determined to be sub microgram using the current setup.

Paper Details

Date Published: 10 May 2012
PDF: 11 pages
Proc. SPIE 8357, Detection and Sensing of Mines, Explosive Objects, and Obscured Targets XVII, 83571H (10 May 2012); doi: 10.1117/12.919149
Show Author Affiliations
Markus Nordberg, Swedish Defence Research Agency (Sweden)
Royal Institute of Technology (Sweden)
Ema Ceco, Swedish Defence Research Agency (Sweden)
Sara Wallin, Swedish Defence Research Agency (Sweden)
Henric Östmark, Swedish Defence Research Agency (Sweden)


Published in SPIE Proceedings Vol. 8357:
Detection and Sensing of Mines, Explosive Objects, and Obscured Targets XVII
J. Thomas Broach; John H. Holloway Jr., Editor(s)

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