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Proceedings Paper

High-detection efficiency and picosecond timing compact detector modules with red-enhanced SPADs
Author(s): Andrea Giudice; Georg Simmerle; Daniele Veronese; Roberto Biasi; Angelo Gulinatti; Ivan Rech; Massimo Ghioni; Piera Maccagnani
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Paper Abstract

In the last years many progresses have been made in the field of silicon Single Photon Avalanche Diodes (SPAD) thanks to the improvements both in device design and in fabrication technology. Particularly, the Dipartimento di Elettronica e Informazione of Politecnico di Milano and the CNR-IMM of Bologna have been in the forefront of this research activity by designing and fabricating a new device structure enabling the fabrication of SPADs with red enhanced photon detection efficiency. In this paper we present a compact photon counting and timing module that fills the gap between the high temporal resolution and the high detection efficiency systems. The module exploits Red-Enhanced SPAD technology to attain a Photon Detection Efficiency (PDE) as high as 37% at 800 nm (peak of 58% at 600 nm) while maintaining a temporal resolution of about 100 ps FWHM, even with light diffused across the whole active area. A thermo-electric cooling system guarantees a noise as low as few counts per second for a 50 μm diameter SPAD while a low threshold avalanche pick-up circuit assures a limited shift in the temporal response.

Paper Details

Date Published: 22 May 2012
PDF: 8 pages
Proc. SPIE 8375, Advanced Photon Counting Techniques VI, 83750P (22 May 2012); doi: 10.1117/12.919120
Show Author Affiliations
Andrea Giudice, Micro Photon Devices (Italy)
Georg Simmerle, Micro Photon Devices (Italy)
Daniele Veronese, Micro Photon Devices (Italy)
Roberto Biasi, Micro Photon Devices (Italy)
Angelo Gulinatti, Politecnico di Milano (Italy)
Ivan Rech, Politecnico di Milano (Italy)
Massimo Ghioni, Micro Photon Devices (Italy)
Politecnico di Milano (Italy)
Piera Maccagnani, IMM-CNR sezione di Bologna (Italy)

Published in SPIE Proceedings Vol. 8375:
Advanced Photon Counting Techniques VI
Mark A. Itzler, Editor(s)

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