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Proceedings Paper

Stand-off real-time synthetic imaging at mm-wave frequencies
Author(s): Matthias Kahl; Andreas Keil; Joern Peuser; Torsten Loeffler; Martin Paetzold; Andreas Kolb; Thorsten Sprenger; Bernd Hils; Peter Haring Bolívar
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Paper Abstract

We report on the development of an active stand-off imaging system operating in the 80 GHz - 110 GHz frequency range. 3D real-time imaging is enabled by a combination of a mechanically scanned one-dimensional conventional imaging projection with a rotating metallic reflector and a two-dimensional synthetic imaging reconstruction with a linear array of transmitter (Tx) and receiver (Rx) elements. The system is conceived, in order to allow a resolution better than 1cm both in lateral, as well as in range directions by using a multi-view imaging geometry with an aperture larger than 2 m x 2 m. The operation distance is 8.5 - 9 m. The 2D synthetically reconstructed imaging planes are derived from the correlation of 20 sources and 24 coherent detectors. Range information is obtained by operating in a frequency modulated continuous wave (FMCW) mode. Real-time imaging is enabled by implementing the synthetic image reconstruction algorithms on a general purpose graphics processing unit (GPGPU) system. A multi-view imaging geometry is implemented, in order to enhance the imaging resolution and to reduce the influence of specular reflections.

Paper Details

Date Published: 9 May 2012
PDF: 11 pages
Proc. SPIE 8362, Passive and Active Millimeter-Wave Imaging XV, 836208 (9 May 2012); doi: 10.1117/12.919104
Show Author Affiliations
Matthias Kahl, Univ. Siegen (Germany)
Andreas Keil, SynView GmbH (Germany)
Joern Peuser, SynView GmbH (Germany)
Torsten Loeffler, SynView GmbH (Germany)
Martin Paetzold, Univ. Siegen (Germany)
Andreas Kolb, Univ. Siegen (Germany)
Thorsten Sprenger, Huebner GmbH (Germany)
Bernd Hils, Goethe Univ. (Germany)
Peter Haring Bolívar, Univ. Siegen (Germany)


Published in SPIE Proceedings Vol. 8362:
Passive and Active Millimeter-Wave Imaging XV
David A. Wikner; Arttu R. Luukanen, Editor(s)

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