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Proceedings Paper

Examining epsilon near zero structures through effective medium theory and optical thin film analysis
Author(s): Jason C. Vap; Michael A. Marciniak; Mark Moran; Linda Johnson
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Paper Abstract

Epsilon near zero (ENZ) structures are of increasing interest with developments initially directed at metal-dielectric material combinations and recently extended to doped semiconductor-dielectric combinations - all in an effort to drive the permittivity and wave number of the structure near zero. Of further interest is the effective theoretical characterization of these multi-layered material structures. We investigate increasing the number of layers - from one to four - of a visible ENZ design structure. Theoretical predictions are compared with experimental material properties collected from ellisometry; the region where effective medium theory breaks down and optical thin film analysis succeeds are examined.

Paper Details

Date Published: 8 June 2012
PDF: 8 pages
Proc. SPIE 8364, Polarization: Measurement, Analysis, and Remote Sensing X, 83640Q (8 June 2012); doi: 10.1117/12.919053
Show Author Affiliations
Jason C. Vap, Air Force Institute of Technology (United States)
Michael A. Marciniak, Air Force Institute of Technology (United States)
Mark Moran, Naval Air Warfare Ctr. (United States)
Linda Johnson, Naval Air Warfare Ctr. (United States)


Published in SPIE Proceedings Vol. 8364:
Polarization: Measurement, Analysis, and Remote Sensing X
David B. Chenault; Dennis H. Goldstein, Editor(s)

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