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Proceedings Paper

Method of using area CCD to obtain the reflectivity curve
Author(s): Wenping Guo; Gang Lu; Kecheng Yang; Min Xia; Wei Li; Jie Dai; Xiaohui Zhang
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Paper Abstract

Reflectivity curve is always used for refractive index measurement. With the help of a mechanical scanning part, conventional method alters the incident angle of a collimated beam to obtain the reflectivity curve, but it has troublesome drawbacks that mechanical scanning is time consuming and would introduce mechanical error. In this paper, a proposed method exploits the reflection characteristic of divergent beam at the critical angle. Its principle using area CCD to obtain the reflectivity curve is demonstrated by simulation. The result shows that the proposed method can instantaneously obtain the reflectivity curve without mechanical errors.

Paper Details

Date Published: 17 February 2012
PDF: 6 pages
Proc. SPIE 8332, Photonics and Optoelectronics Meetings (POEM) 2011: Optoelectronic Sensing and Imaging, 83320W (17 February 2012); doi: 10.1117/12.918736
Show Author Affiliations
Wenping Guo, Huazhong Univ. of Science and Technology (China)
Gang Lu, Nanjing Univ. of Science and Technology (China)
Kecheng Yang, Huazhong Univ. of Science and Technology (China)
Min Xia, Huazhong Univ. of Science and Technology (China)
Wei Li, Huazhong Univ. of Science and Technology (China)
Jie Dai, Huazhong Univ. of Science and Technology (China)
Xiaohui Zhang, Huazhong Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 8332:
Photonics and Optoelectronics Meetings (POEM) 2011: Optoelectronic Sensing and Imaging
Pierre Galarneau; Xu Liu; Pengcheng Li, Editor(s)

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