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Proceedings Paper

Method to determine influence functions for complex optical systems
Author(s): Rudolf Saathof; Jo W. Spronck; Robert H. Munnig Schmidt
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Paper Abstract

In this paper an expression is derived to determine influence functions for optical imaging systems. The influence function describes the wavefront change, caused by a deviation of an optical surface from its nominal shape due to any arbitrary reason. The method is derived with the help of the paraxial approximation, using the optical design prescription from software such as Code V or Zemax. The presented method can be used for diffraction limited projection systems. It helps with modelling wave front aberrations caused by desired and undesired deviations of the optical surface from its nominal shape. So it can be used for modelling mirror vibrations, thermal aberrations, the influence of manufacturing errors or Adaptive Optical systems without using optical ray-tracing programs.

Paper Details

Date Published: 5 May 2012
PDF: 10 pages
Proc. SPIE 8429, Optical Modelling and Design II, 842907 (5 May 2012); doi: 10.1117/12.918405
Show Author Affiliations
Rudolf Saathof, Technische Univ. Delft (Netherlands)
Jo W. Spronck, Technische Univ. Delft (Netherlands)
Robert H. Munnig Schmidt, Technische Univ. Delft (Netherlands)


Published in SPIE Proceedings Vol. 8429:
Optical Modelling and Design II
Frank Wyrowski; John T. Sheridan; Jani Tervo; Youri Meuret, Editor(s)

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