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Proceedings Paper

The research of the accurate measure of static transfer function for the TDI CCD camera
Author(s): Guo-ning Li; Wen-hua Wang; Shuang-li Han; Long-xu Jin; Yan-Yan Liu
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Paper Abstract

In the test course of static transfer function of TDI CCD camera, because of the influence that gets environmental and artificial etc. factor, the value of static transfer function measured at any time is between unceasing fluctuation, so, make accuracy reduce. To solve this problem, a kind of accurate measurement technique of static transfer function is put forward. First, before carrying out the measure of static quiet of transfer function, the best test point of transfer function of the TDI CCD camera must be determined, it is parallel to guarantee the rectangle target surface of parallel optical pipe and camera focal plane maintenance parallel, and again guarantee target strip in rectangle target and TDI CCD in camera focal plane maintenance vertical. TDI CCD catches rectangle target image, per 1000 lines of target mark image as a measures sample of static transfer function, exclude because of atmosphere tremble twisted, vague rectangle target mark image, retain 500 distinct and steady target mark image as measure sample set. Then, calculate the static transfer function of each measure sample respectively, take the average of all static quiet transfer function in measure sample set as the static transfer function of camera. Finally, the measure of the static transfer function for TDI CCD camera makes error analysis. Experimental results indicate that the value of the static transfer function of TDI CCD camera measured with this kind of method is 0.2923, with before measurement technique comparison, the value of static transfer function has raised 0.02, makes the accuracy of the measure of static transfer function have gotten raising.

Paper Details

Date Published: 17 February 2012
PDF: 8 pages
Proc. SPIE 8332, Photonics and Optoelectronics Meetings (POEM) 2011: Optoelectronic Sensing and Imaging, 83320Z (17 February 2012); doi: 10.1117/12.917907
Show Author Affiliations
Guo-ning Li, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Wen-hua Wang, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Shuang-li Han, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Long-xu Jin, Changchun Institute of Optics, Fine Mechanics and Physics (China)
Yan-Yan Liu, Changchun Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 8332:
Photonics and Optoelectronics Meetings (POEM) 2011: Optoelectronic Sensing and Imaging
Pierre Galarneau; Xu Liu; Pengcheng Li, Editor(s)

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